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Department of Materials Science and Engineering


People

In This Section

Prof. Ast

Dieter Ast

Dieter G. Ast

Department Faculty

Office: 229 Bard
Phone: 607.255.4140
Email: dga1@cornell.edu

Professor, Department of MS&E, Cornell University, 1981 – present

Member Technical Staff, 1997/1998, Materials & Measurement Center, Hewlett Packard; Corporate Laboratories, Palo Alto, CA

DAAD Scholar, 1992, Max Planck Institute for Solid State Research, Stuttgart, Germany

Member Technical Staff, 1991/92, High Speed Device Laboratory, Hewlett Packard Corporate Laboratories, Palo Alto, CA

Member Technical Staff, 1983/1984, Hewlett Packard Corporate Laboratories, Palo Alto, CA

Visiting Scientist, Summers,1978-1991, Hewlett Packard Corporate Laboratories, Palo Alto, CA Member Technical Staff 1976/77, IBM T.J. Watson Research Center, Yorktown Heights, N.Y.

Visiting Scientist, 1970-1975, IBM T.J. Watson Research Center, Yorktown Heights

Current Research

Poly-Si and a-Si:H based thin film electronics, mass transport at glass surfaces, impurity transport between glass substrates and deposited thin semiconductor films.

Research Projects

  1. Fabrication of polysilicon based thin film DNA sensors on flexible glass substrates.
  2. Submicron patterning of glass surfaces

Select Publications

  • Investigation of surface mass transport in Al–Si–Ca–oxide glasses via the thermal induced decay of submicron surface gratings Linlin Wang, Adam J. G. Ellison, and Dieter G. Ast J. Appl. Phys. 101, 023530 (2007)
  • Full recovery of electron damage in glass at ambient temperatures Mkhoyan, K.A. (Sch. of Appl. & Eng. Phys., Cornell Univ., Ithaca, NY, USA); Silcox, J.; Ellison, A.; Ast, D.; Dieckmann, R. Source: Physical Review Letters, v 96, n 20, 26 May 2006, p 205506/1-4 
  • Misfit dislocation interactions observed by cathodoluminescence in InGaAs on off-cut, patterned GaAs George Patrick Watson and Dieter G. Ast J. Appl. Phys. 94, 1513 (2003)
  • Resistivity and Hall voltage study of phosphorus segregation in polycrystalline Si1-xGex films Qin, W. (Dept. of Mater. Sci. & Eng., Cornell Univ., Ithaca, NY, USA); Ast, D.G.; Kamins, T.I. Source: Journal of Applied Physics, v 92, n 1, 1 July 2002, p 168-72 
  • Polysilicon thin film transistors on glass-ceramic substrates Krasulya, S.M. (Dept. of Mater. Sci. & Eng., Cornell Univ., Ithaca, NY, USA); Nemchuk, N.I.; Ast, D.G. Source: Thin Film Transistor Technologies V. Proceedings of the International Symposium (Electrochemical Society Proceedings Vol.2000-31), 2001, p 236-46 
  • Micromachined wavelength tunable filter integrated with optical fiber Junting Liu (Dept. of Mater. Sci. & Eng., Cornell Univ., Ithaca, NY, USA); Jeong, J.Y.; Minfan Pai; Pollock, C.R.; Tien, N.C.; Ast, D.G. Source: 2000 IEEE/LEOS International Conference on Optical MEMS (Cat. No.00EX399), 2000, p 109-10

Awards and Recognition

  • Research Assistant, 1961-1966 (Max Planck Institute für Sondermetalle, Stuttgart, Germany)
  • Diplom-Physiker (Mit Auszeichung), 1966 (Universität Stuttgart, Germany)
  • Ph.D, Material Science and Engineering, 1969 (Cornell University)

Graduate Students

  • Dr. Sungwan Won
  • Mr. Yoo-chul Young